Publications

Recent Papers:

  • R. Wuhrer and K.Moran, Post Processing Hyper-Spectral Data and Generating More Information from X-ray Maps (2013)
  • L. Guja, R Wuhrer, K.Moran, K.W. Dixon, G. Wardell-Johnson and D.J. Merritt, Full spectrum X-ray mapping reveals differential localization of salt in germinating seeds of differing salt tolerance (2013)
  • H. Demers, R. Wuhrer, K.Moran and R Gauvin, Effect of the Probe Size and Interaction Volume on Quantitative X-ray Maps across Interfaces of a Cu-Al Roll Bonded Laminate (2013)
  • R. Wuhrer, K. Moran and M. R. Phillips, “Multi-Detector X-Ray Mapping and Generation of Correction Factor Images for Problem Solving“, Microscopy and Microanalysis, 14(suppl 2), 1108CD-1109CD (2008).
  • J. Mak, R. Wuhrer, D. Zhang, W. Yeung and K. Moran, “Characterization of Advance Titanium Metal matrix Composites through Quantitative X-Ray Mapping”, Proceedings of the ACMM-20 & IUMAS-IV Conference, Perth, WA, Australia Feb 2008, pages 427-428.
  • M. Annett-Stuart, K. Moran and R. Wuhrer, “Particle Search Analysis – the way of the future?”, Proceedings of the ACMM-20 & IUMAS-IV Conference, Perth, WA, Australia Feb 2008, pages 320-321.
  • R. Wuhrer and K. Moran, “Correction Factor Images Generated from X-ray Maps”, Proceedings of the ACMM-20 & IUMAS-IV Conference, Perth, WA, Australia Feb 2008, pages 67-68.
  • R. Wuhrer and K. Moran, ”Spectral Imaging and X-Ray Microanalysis with Multiple Detectors“, Microscopy and Microanalysis, 13(suppl 2), 1350CD-1351CD (2007).
  • R. Wuhrer and K. Moran, “Representation of Microstructures through Rapid X-Ray Mapping”, Materials Australia, Volume 38, No 5, September-October (2006) 12-14.
  • D.J. Attard , R. Wuhrer, P.G. Huggett and K. Moran, “ Sample Preparation of a Novel Titanium-Aluminium Composite for EBSD Analysis”, Microscopy and Microanalysis, 12(suppl 2), 1052CD-1053CD (2006).
  • R. Wuhrer, K. Moran and M. R. Phillips,”X-Ray Mapping and Post Processing“, Microscopy and Microanalysis, 12(suppl 2), 1404CD-1405CD (2006).
  • R. Wuhrer, K. Moran, M. R. Phillips and P. Davey, “ X-Ray Mapping Using a Multiple-EDS (DUAL) Detectors”, Microscopy and Microanalysis, 12(suppl 2), 1406CD-1407CD (2006).
  • R. Wuhrer and K. Moran, “Representation of Microstructures through Rapid X-Ray Mapping”, Materials Australia, Volume 38, No 5, September-October (2006) 12-14.
  • R. Wuhrer and K.Moran, X-Ray Mapping Considerations and Difficulties (2005)
  • R. Wuhrer and K.Moran, X-Ray Mapping Using Multiple-EDS and WDS Detectors (2005)
  • R. Wuhrer and K.Moran, X-Ray Mapping and Interpretation of Scatter Diagrams (2005)
  • R. Wuhrer, K. Moran and L. Moran, Characterisation of Materials Through X-ray Mapping (2005)

Recent Posters: