SEM and X-Ray Microanalysis Courses
| About our courses |
Our aim in running these courses is to give an overview of X-ray Microanalysis techniques including Energy Dispersive Analysis, Wavelength Dispersive Analysis and Microscope operation. Since the courses are 'hands-on', the number of participants is limited, so please Contact to register your application early. We also offer on site training.
The next SEM, EDS, XRM Course will be in Feb 2014
These courses will be conducted either at a specific University or at the Bungonia school of Microanalysis. Please call or Contact for an application form.
Typical Course Content:
The SEM section aims to develop high level scientific and technical skills of direct relevance to anyone embarking the study of specimens at the microscopic level, or the evaluation, testing or analysis of a wide range of materials. Course participants will learn about basic operation of SEMís and ESEMís (environmental scanning electron microscopes). In this section a considerable proportion of their time will be spent learning to be competent operators of a SEM, measuring and analysing experimental data, and discussing strategies for accurate interpretation.
Determination of accelerating voltage (keV), resolution versus count rate, CuL to CuK ratio, Calibration, Pulse Pile up, Spectra comparison, Labelling and Peak Identification, Take-off Angle and Sample Placement Requirements and Positioning, Looking for artefacts, Specimen Preparation Techniques, Standards, Coating Requirements and Generating Reports.
Collection strategies, Display of data, Major and Trace Quantitative Element Analysis, Quantitative Mapping and Line Profiles, Detection Limits, Combined EDS / WDS Mapping, Light Element Mapping, Chemical Imaging
Spectrum stripping and Overlap correction, Deadtime correction, Standardless v's Standards analysis, Major and Trace Element Analysis, Quantitative Element Analysis, Thin film Corrections, Pseudo Standards, Light Element Analysis.
Wavelength scans, Peak resolution compared against EDS, Peak to Background Ratios compared to EDS, Detection Limits, X-Ray count chain electronics, Peak and Background Measurement Positions, Pulse Height Determinations, Mechanical requirements such as 'Which crystal and detector type to use for which elements?', Standards Selection, Standardisation and Analysis Techniques including Major and Trace Quantitative Element Analysis, Combined EDS / WDS Analysis, Light Element Analysis.
Please feel free to contact Moran Scientific to discuss your requirements.