Publications

• R. Wuhrer and K. Moran, “FEGSEM Dedicated X-Ray Mapping System with Multiple Silicon Drift Detectors for Quantitative X-Ray Mapping”, AMAS2019, 15th Biennial Australian Microbeam Analysis Symposium, 11-15 February Melbourne Victoria, Australia, 2019
• R. Wuhrer, K. Moran, “A new life for the wavelength-dispersive X-ray spectrometer (WDS): Incorporation of a silicon drift detector into the WDS for improved quantification and X-ray mapping”, (2018) IOP Conference Series: Materials Science and Engineering, 304 (1), 012021.
• R. Wuhrer, K. Mason and K. Moran, “Next Generation of Instruments Required - Not just X-Ray Imaging but Combined EDS, CL, GSR, XRM, XRD and Raman Systems”, Microsc. Microanal. 24 (Suppl 1), 2018, pp996-997
• K. Moran and R. Wuhrer, “SD-WDS Second Order Bremsstrahlung and Peak to Background Ratios”, Microsc. Microanal. 24 (Suppl 1), 2018, pp756-757
• R. Wuhrer and K. Moran “Incorporation of an Amptek Silicon Drift Detector into a Wavelength Dispersive Spectrometer (WDS) Replacing the Gas Flow Proportional Counter”, Microsc. Microanal. 23 (Suppl 1), 2017, pp1048-1049.
• R.Wuhrer, Moran, K., “Low voltage imaging and X-ray microanalysis in the SEM: Challenges and opportunities”, (2016) IOP Conference Series: Materials Science and Engineering, 109 (1), 012019.
• R. Wuhrer and K. Moran, “Quantitative X-ray mapping, scatter diagrams and the generation of correction maps to obtain more information about your material”, IOP Conference Series: Materials Science and Engineering Volume 55, Issue 1, (2014).
• H. Demers, N. Brodusch, R. Wuhrer, K. Moran, P. Woo and R. Gauvin, “X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector”, Microsc. Microanal. 20 (Suppl 3), 2014, p676-677.
• R. Wuhrer, L. Guja, D. Merritt and K. Moran, “X-Ray Mapping Investigations of Salt Migration in Seeds through use of Window and Windowless Silicon Drift Detectors”, Microsc. Microanal. 20 (Suppl 3), 2014, p634-635
• R. Wuhrer and K.Moran, Post Processing Hyper-Spectral Data and Generating More Information from X-ray Maps (2013)
• L. Guja, R Wuhrer, K.Moran, K.W. Dixon, G. Wardell-Johnson and D.J. Merritt, Full spectrum X-ray mapping reveals differential localization of salt in germinating seeds of differing salt tolerance (2013)
• H. Demers, R. Wuhrer, K.Moran and R Gauvin, Effect of the Probe Size and Interaction Volume on Quantitative X-ray Maps across Interfaces of a Cu-Al Roll Bonded Laminate (2013)
• R. Wuhrer, K. Moran and M. R. Phillips, “Multi-Detector X-Ray Mapping and Generation of Correction Factor Images for Problem Solving“, Microscopy and Microanalysis, 14(suppl 2), 1108CD-1109CD (2008).
• J. Mak, R. Wuhrer, D. Zhang, W. Yeung and K. Moran, “Characterization of Advance Titanium Metal matrix Composites through Quantitative X-Ray Mapping”, Proceedings of the ACMM-20 & IUMAS-IV Conference, Perth, WA, Australia Feb 2008, pages 427-428.
• M. Annett-Stuart, K. Moran and R. Wuhrer, “Particle Search Analysis – the way of the future?”, Proceedings of the ACMM-20 & IUMAS-IV Conference, Perth, WA, Australia Feb 2008, pages 320-321.
• R. Wuhrer and K. Moran, “Correction Factor Images Generated from X-ray Maps”, Proceedings of the ACMM-20 & IUMAS-IV Conference, Perth, WA, Australia Feb 2008, pages 67-68.
• R. Wuhrer and K. Moran, ”Spectral Imaging and X-Ray Microanalysis with Multiple Detectors“, Microscopy and Microanalysis, 13(suppl 2), 1350CD-1351CD (2007).
• R. Wuhrer and K. Moran, “Representation of Microstructures through Rapid X-Ray Mapping”, Materials Australia, Volume 38, No 5, September-October (2006) 12-14.
• D.J. Attard , R. Wuhrer, P.G. Huggett and K. Moran, “ Sample Preparation of a Novel Titanium-Aluminium Composite for EBSD Analysis”, Microscopy and Microanalysis, 12(suppl 2), 1052CD-1053CD (2006).
• R. Wuhrer, K. Moran and M. R. Phillips,”X-Ray Mapping and Post Processing“, Microscopy and Microanalysis, 12(suppl 2), 1404CD-1405CD (2006).
• R. Wuhrer, K. Moran, M. R. Phillips and P. Davey, “ X-Ray Mapping Using a Multiple-EDS (DUAL) Detectors”, Microscopy and Microanalysis, 12(suppl 2), 1406CD-1407CD (2006).
• R. Wuhrer and K. Moran, “Representation of Microstructures through Rapid X-Ray Mapping”, Materials Australia, Volume 38, No 5, September-October (2006) 12-14.
• R. Wuhrer and K.Moran, X-Ray Mapping Considerations and Difficulties (2005)
• R. Wuhrer and K.Moran, X-Ray Mapping Using Multiple-EDS and WDS Detectors (2005)
• R. Wuhrer and K.Moran, X-Ray Mapping and Interpretation of Scatter Diagrams (2005)
• R. Wuhrer, K. Moran and L. Moran, Characterisation of Materials Through X-ray Mapping (2005)

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